An FPGA-Based Test System for RRAM Technology Characterization

Resistive random access memory (RRAM) technologies have recently gained large attention from the academic and industrial research communities. Significant efforts have been made to enhance the performance of the memory stacks from both communities through the design, simulation, and fabrication of novel devices. In this context, improvements can only be confirmed through a thorough device characterization process. Here comes a gap between industry and academia that usually lacks high-end test equipment to perform systematic device characterizations. In this paper, we propose a solution to fill this gap by introducing an easy, affordable, and effective field programmable gate array based RRAM characterization system.


Published in:
IEEE Transactions on Nanotechnology, 17, 1, 177-183
Year:
Jan 01 2018
ISSN:
1536-125X
Keywords:
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Note: The status of this file is: EPFL only


 Record created 2018-01-09, last modified 2018-12-03

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