Components for high-speed atomic force microscopy optimized for low phase-lag


Published in:
2017 IEEE International Conference on Advanced Intelligent Mechatronics (AIM), 731-736
Presented at:
2017 IEEE International Conference on Advanced Intelligent Mechatronics (AIM), Munich, Germany, 3-7 July 2017
Year:
2017
Publisher:
IEEE
Laboratories:


Note: The status of this file is: EPFL only


 Record created 2017-11-16, last modified 2018-09-13

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