Components for high-speed atomic force microscopy optimized for low phase-lag


Published in:
2017 IEEE International Conference on Advanced Intelligent Mechatronics (AIM), 731-736
Presented at:
2017 IEEE International Conference on Advanced Intelligent Mechatronics (AIM), Munich, Germany, 3-7 July 2017
Year:
2017
Publisher:
IEEE
Laboratories:


Note: The status of this file is: EPFL only


 Record created 2017-11-16, last modified 2018-01-28

External link:
Download fulltext
n/a
Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)