Variability of Low Frequency Noise and mismatch in CORNER DOPED and standard CMOS technology


Published in:
2017 International Conference on Noise and Fluctuations (ICNF), 1-4
Presented at:
2017 International Conference on Noise and Fluctuations (ICNF), Vilnius, Lithuania, 20-23 June 2017
Year:
2017
Publisher:
IEEE
Laboratories:




 Record created 2017-08-02, last modified 2018-01-28


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