The inventive method for measuring the optical properties of transparent and/or diffusive objects (18), especially their reflection profile, uses two coupled interferometers. Said coupled interferometers are operated with two beams of different coherence lengths. The object to be measured (18) is exposed to the beam with the short coherence length. A path length variation unit (15) is located in the common branch of the two interferometers. This unit impresses a double frequency on both beams, and this double frequency is then evaluated. A device for carrying out the method can be used especially as a reflectometer, preferably for applications in the area of surface diagnosing, optical tomography and photometry, as a high-dynamic means of determining optical properties with a high signal-noise ratio.