000228938 001__ 228938
000228938 005__ 20180318220816.0
000228938 020__ $$a9783527808465
000228938 0247_ $$2doi$$a10.1002/9783527808465
000228938 037__ $$aCONF
000228938 245__ $$aThree-dimensional electron imaging of dislocations from a single sample tilt
000228938 269__ $$a2016
000228938 260__ $$bWiley$$c2016
000228938 336__ $$aConference Papers
000228938 520__ $$aLinear crystal defects called dislocations are one of the most fascinating concepts in materials science that govern mechanical and optoelectronic properties of many materials across a broad range of application. Three-dimensional (3-D) study of dislocation network is in principle accessible by conventional tomographic and stereoscopic techniques in Transmission Electron Microscopy (TEM). In these techniques in general the need to tilt the specimen for acquiring image series over large tilt ranges remain however an intricate problem, in particular when diffraction contrast or sensitivity to electron beam are involved.  Here, a novel method in scanning TEM (STEM) is presented that provides a reliable and fast assessment of the 3-D configuration of dislocations using data acquired from just one sample tilt. This technique acquires a stereoscopic pair of images by selecting different ray paths of a convergent illumination in STEM mode. The resulting images are then treated with a dedicated stereovision reconstruction algorithm, yielding a full 3-D reconstruction of dislocations arrangement. The success of this method is demonstrated by measurement of dislocation arrangements in two experimental cases.
000228938 6531_ $$aDislocation
000228938 6531_ $$a3D reconstruction
000228938 6531_ $$aStereovision
000228938 6531_ $$aTEM
000228938 700__ $$0242227$$aOveisi, Emad$$g191661
000228938 700__ $$aLetouzey, Antoine
000228938 700__ $$0240252$$aFua, Pascal$$g112366
000228938 700__ $$0240075$$aHébert, Cécile$$g178548
000228938 7112_ $$aThe 16th European Microscopy Congress 2016$$cLyon, France$$d28 August - 2 September, 2016
000228938 909CO $$ooai:infoscience.tind.io:228938$$pconf$$pIC$$pSB
000228938 909C0 $$0252025$$pCIME$$xU10192
000228938 909C0 $$0252087$$pCVLAB$$xU10659
000228938 909C0 $$0252032$$pLSME$$xU11814
000228938 917Z8 $$x191661
000228938 937__ $$aEPFL-CONF-228938
000228938 973__ $$aEPFL$$rNON-REVIEWED$$sPUBLISHED
000228938 980__ $$aCONF