000226991 001__ 226991
000226991 005__ 20181203024622.0
000226991 0247_ $$2doi$$a10.1039/c6ta09035d
000226991 022__ $$a2050-7488
000226991 02470 $$2ISI$$a000395309800017
000226991 037__ $$aARTICLE
000226991 245__ $$aMicro-solid state energy conversion membranes: influence of doping and strain on oxygen ion transport and near order for electrolytes
000226991 260__ $$bRoyal Soc Chemistry$$c2017$$aCambridge
000226991 269__ $$a2017
000226991 300__ $$a9
000226991 336__ $$aJournal Articles
000226991 520__ $$aEnhancing the efficiency of micro-energy conversion devices through engineering of the structure-transport relationship is a prerequisite toward next generation micro-electrolysers and fuel cells. Here, oxygen ion conducting free-standing thin films are key elements, forming buckled and strained membranes for gas exchange and energy conversion. The electro-chemo-mechanics of free-standing membranes vs. substrate-supported films are investigated as model device structures to study the factors influencing the ionic transport, and answer the fundamental question: how strongly does solid solution doping vs. lattice strain affect the defect-induced oxygen ion transport in buckled electrolyte membrane films for solid state micro-devices? Importantly, we demonstrate that tuning the electro-chemo- mechanics of doped ceria films can influence the ionic transport through the effect of opposed strained volumes altering the clustering of oxygen vacancy defects. Strain is studied by comparing flat substrate-supported films to compressive buckled membrane devices and observing subsequent changes in atomistic near order via Raman spectroscopy. The buckling resulted in a significant increase of the activation energy for ionic transport, greater than classical extrinsic doping. The power of electrochemo- mechanic engineering of ceramic films is demonstrated in finding the best strategy for optimizing ionic conduction and thereby enhancing future performance in thin film electrolytes for micro-energy conversion devices.
000226991 700__ $$uSwiss Fed Inst Technol, Electrochem Mat, Dept Mat, Zurich, Switzerland$$aShi, Yanuo
000226991 700__ $$uSwiss Fed Inst Technol, Electrochem Mat, Dept Mat, Zurich, Switzerland$$aGarbayo, Inigo
000226991 700__ $$0240369$$g105945$$aMuralt, Paul
000226991 700__ $$aRupp, Jennifer Lilia Marguerite$$uSwiss Fed Inst Technol, Electrochem Mat, Dept Mat, Zurich, Switzerland
000226991 773__ $$j5$$tJournal Of Materials Chemistry A$$k8$$q3900-3908
000226991 909C0 $$xU10334$$0252012$$pLC
000226991 909CO $$pSTI$$particle$$ooai:infoscience.tind.io:226991
000226991 937__ $$aEPFL-ARTICLE-226991
000226991 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000226991 980__ $$aARTICLE