Retention Time Characterization of Commercial DRAM Modules Using an FPGA-based Test Platform


Advisor(s):
Karakonstantis, Georgios
Constantin, Jeremy Hugues-Felix
Burg, Andreas Peter
Year:
2014
Laboratories:


Note: The status of this file is: Involved Laboratories Only


 Record created 2017-02-24, last modified 2019-12-05

n/a:
Download fulltext
PDF

Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)