Retention Time Characterization of Commercial DRAM Modules Using an FPGA-based Test Platform
2014
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Details
Title
Retention Time Characterization of Commercial DRAM Modules Using an FPGA-based Test Platform
Author(s)
Pignat, Eliéva Arlette
Date
2014
Laboratories
TCL
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > TCL - Telecommunications Circuits Laboratory
Work produced at EPFL
Student projects
Work produced at EPFL
Student projects
Work type
Semester assignment
Record creation date
2017-02-24