Hybrid halide perovskite photovoltaic materials show a remarkable light conversion efficiency in various optoelectronic devices. In the fabrication of these solar cells, light emitting diodes, laser and photodetector prototypes the thickness of the perovskite is an important parameter since the light is absorbed within a thin layer of a few hundred nanometers. Nevertheless, making perovskite coatings with various solution-based and evaporation methods showing highly reproducible thickness and area coverage is still an issue. Therefore, rapid and reliable quality-control of the film morphology is needed. This report shows a simple, rapid, and calibration-free method for reading the thickness directly from the color map of nanowire perovskite films seen in standard optical microscope with visible light. (C) 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim