000222347 001__ 222347
000222347 005__ 20181007231418.0
000222347 0247_ $$2doi$$a10.1063/1.4959832
000222347 022__ $$a0003-6951
000222347 02470 $$2ISI$$a000381688900019
000222347 037__ $$aARTICLE
000222347 245__ $$aExciton dynamics at a single dislocation in GaN probed by picosecond time-resolved cathodoluminescence
000222347 260__ $$aMelville$$bAmer Inst Physics$$c2016
000222347 269__ $$a2016
000222347 300__ $$a5
000222347 336__ $$aJournal Articles
000222347 520__ $$aWe investigate the dynamics of donor bound excitons (D degrees X-A) at T = 10K around an isolated single edge dislocation in homoepitaxial GaN, using a picosecond time-resolved cathodoluminescence (TR-CL) setup with high temporal and spatial resolutions. An similar to 1.3 meV dipole-like energy shift of D degrees X-A is observed around the dislocation, induced by the local strain fields. By simultaneously recording the variations of both the exciton lifetime and the CL intensity across the dislocation, we directly assess the dynamics of excitons around the defect. Our observations are well reproduced by a diffusion model. It allows us to deduce an exciton diffusion length of similar to 24 nm as well as an effective area of the dislocation with a radius of similar to 95 nm, where the recombination can be regarded as entirely non-radiative. (C) 2016 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
000222347 700__ $$0248983$$aLiu, W.$$g253919
000222347 700__ $$0240056$$aCarlin, J. -F.$$g104706
000222347 700__ $$0244550$$aGrandjean, N.$$g161577
000222347 700__ $$0241178$$aDeveaud, B.$$g104954
000222347 700__ $$0246748$$aJacopin, G.$$g227725
000222347 773__ $$j109$$k4$$q042101$$tApplied Physics Letters
000222347 8564_ $$s2366814$$uhttps://infoscience.epfl.ch/record/222347/files/APL-1.4959832-Exciton%20dynamics%20at%20a%20single%20dislocation%20in%20GaN%20probed%20by%20picosecond%20time-resolved%20cathodoluminescence.pdf$$yn/a$$zn/a
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000222347 937__ $$aEPFL-ARTICLE-222347
000222347 973__ $$aEPFL$$rREVIEWED$$sPUBLISHED
000222347 980__ $$aARTICLE