000221916 001__ 221916
000221916 005__ 20190812205928.0
000221916 02470 $$2ISI$$a000383221700057
000221916 037__ $$aCONF
000221916 245__ $$aActive Guard Ring Characterization for Smart Power ICs
000221916 269__ $$a2016
000221916 260__ $$bIeee$$c2016$$aNew York
000221916 300__ $$a5
000221916 336__ $$aConference Papers
000221916 520__ $$aThis paper shows SPICE simulation results of active guard ring structures which are typically employed in Smart Power ICs. Active guard rings act as barriers limiting the flow of minority carriers injected into the substrate toward sensitive circuits. The physical mechanisms involved in the active guard rings are confirmed with SPICE simulation for the first time and are in good agreement with those obtained from technology computer aided design simulations and measurements of dedicated test structures shown in literature.
000221916 6531_ $$aActive Protection
000221916 6531_ $$aActive Barrier
000221916 6531_ $$aSubstrate Modeling
000221916 6531_ $$aNoise Coupling
000221916 6531_ $$aSmart Power ICs
000221916 700__ $$0246408$$g163217$$aBuccella, Pietro
000221916 700__ $$0246994$$g206323$$aStefanucci, Camillo
000221916 700__ $$0241224$$g106334$$aSallese, Jean-Michel
000221916 700__ $$0240539$$g105540$$aKayal, Maher
000221916 7112_ $$dJune 23-25, 2016$$cLodz, Poland$$a23rd International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES)
000221916 720_1 $$aNapieralski, A$$eed.
000221916 773__ $$tProceedings of The 23rd International Conference on Mixed Design of Integrated Circuits And Systems (Mixdes 2016)$$q305-309
000221916 909C0 $$pEDLAB$$0252605
000221916 909C0 $$0252315$$xU11978$$pELAB
000221916 909CO $$pconf$$pSTI$$ooai:infoscience.tind.io:221916
000221916 917Z8 $$x105540
000221916 917Z8 $$x144315
000221916 917Z8 $$x144315
000221916 937__ $$aEPFL-CONF-221916
000221916 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000221916 980__ $$aCONF