000221303 001__ 221303
000221303 005__ 20190317000523.0
000221303 02470 $$2ISI
000221303 0247_ $$a10.1145/2988234$$2doi
000221303 02470 $$a000396158500005
000221303 037__ $$aARTICLE
000221303 245__ $$aA Fault Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors
000221303 260__ $$c2016-11-15
000221303 269__ $$a2016-11-15
000221303 300__ $$a13
000221303 336__ $$aJournal Articles
000221303 520__ $$aThis paper deals with the effects of faults on circuits implemented with controllable-polarity transistors. We propose a new fault model that suits the characteristics of these devices, and report the results of a SPICE-based analysis of the effects of faults on the behavior of some basic gates implemented with them. Hence, we show that the considered devices are able to intrinsically tolerate a rather high number of faults. We finally exploit this property to build a robust and scalable adder which is shown to tolerate all single faults and more than 99.5% of the double faults. Its area, performance and leakage power characteristics are improved by 15%, 18% and 12%, respectively, when compared to an equivalent FinFET solution at 22-nm technology node.
000221303 536__ $$aEU funding$$cERC Cybercare 669354 /   SNF 200021-146600
000221303 6531_ $$aNano-electronics
000221303 6531_ $$acontrollable-polarity transistors
000221303 6531_ $$afault tolerant adder
000221303 700__ $$aGhasemzadeh-Mohammadi, Hassan
000221303 700__ $$aGaillardon, Pierre-Emmanuel
000221303 700__ $$g212096$$aZhang, Jian$$0245831
000221303 700__ $$g167918$$aDe Micheli, Giovanni$$0240269
000221303 700__ $$aSanchez, Ernesto
000221303 700__ $$aSanzo-Reorda, Matteo
000221303 773__ $$k2$$j13$$tACM Journal on Emerging Technologies in Computing Systems
000221303 8560_ $$fcarole.burget@epfl.ch
000221303 8564_ $$uhttps://infoscience.epfl.ch/record/221303/files/a16-mohammadi.pdf$$zn/a$$s772475$$yn/a
000221303 909C0 $$xU11140$$0252283$$pLSI1
000221303 909CO $$particle$$qGLOBAL_SET$$ooai:infoscience.tind.io:221303$$pSTI$$pIC
000221303 917Z8 $$x112915
000221303 917Z8 $$x112915
000221303 917Z8 $$x112915
000221303 937__ $$aEPFL-ARTICLE-221303
000221303 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000221303 980__ $$aARTICLE