000220226 001__ 220226
000220226 005__ 20190617200518.0
000220226 0247_ $$2doi$$a10.1063/1.4953908
000220226 022__ $$a0021-9606
000220226 02470 $$2ISI$$a000378926100003
000220226 037__ $$aARTICLE
000220226 245__ $$aImportance of rotationally inelastic processes in low-energy Penning ionization of CHF3
000220226 260__ $$bAmerican Institute of Physics$$c2016$$aMelville
000220226 269__ $$a2016
000220226 300__ $$a4
000220226 336__ $$aJournal Articles
000220226 520__ $$aLow energy reaction dynamics can strongly depend on the internal structure of the reactants. The role of rotationally inelastic processes in cold collisions involving polyatomic molecules has not been explored so far. Here we address this problem performing a merged-beam study of the He*+CHF$_3$ Penning ionization reaction in a range of collision energies $E/k_B$=0.5--120 K. The experimental cross sections are compared with total reaction cross sections calculated within the framework of the quantum defect theory. We find that the broad range of collision energies combined with the relatively small rotational constants of \chfs makes rotationally inelastic collisions a crucial player in the total reaction dynamics. Quantitative agreement between theory and experiment is only obtained if the energy-dependent probability for rotational excitation is included in the calculations, in stark contrast to previous experiments where classical scaling laws were able to describe the results.
000220226 6531_ $$aCold Chemistry
000220226 6531_ $$aInelastic Collisions
000220226 6531_ $$aMerged Neutral Beams
000220226 700__ $$0247482$$g239915$$aJankunas, Justin
000220226 700__ $$aJachymski, Krzysztof
000220226 700__ $$aHapka, Michal
000220226 700__ $$aOsterwalder, Andreas$$g116115$$0243488
000220226 773__ $$j144$$tJournal of Chemical Physics$$q221102
000220226 8564_ $$uhttp://arxiv.org/abs/1604.08778$$zURL
000220226 909C0 $$xU12027$$0252210$$pGR-OST
000220226 909CO $$ooai:infoscience.tind.io:220226$$qGLOBAL_SET$$pSB$$particle
000220226 917Z8 $$x116115
000220226 917Z8 $$x252028
000220226 917Z8 $$x252028
000220226 917Z8 $$x116115
000220226 937__ $$aEPFL-ARTICLE-220226
000220226 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000220226 980__ $$aARTICLE