000219506 001__ 219506
000219506 005__ 20190416055553.0
000219506 0247_ $$2doi$$a10.1016/j.orgel.2016.05.016
000219506 022__ $$a1566-1199
000219506 02470 $$2ISI$$a000377409800019
000219506 037__ $$aARTICLE
000219506 245__ $$aMechanical integrity of hybrid indium-free electrodes for flexible devices
000219506 260__ $$bElsevier$$c2016$$aAmsterdam
000219506 269__ $$a2016
000219506 300__ $$a6
000219506 336__ $$aJournal Articles
000219506 500__ $$aIMT Number : 865
000219506 520__ $$aMaintaining electrical conductivity, optical transparency, and mechanical integrity against bending and stretching are key requirements for flexible transparent electrodes. Transparent conducting oxides (TCOs) are widely used thin film electrodes in optoelectronic devices. However, these materials are brittle and reducing film thickness to improve their mechanical integrity compromises their electrical performance. Here we combine TCO thin films with metal grids embedded in a polymer substrate to create hybrid electrodes with low sheet resistance and high resilience to bending. Amorphous zinc tin oxide (ZTO) and aluminum-doped zinc oxide (AZO) films sputtered onto polyethylene-terephthalate (PET) substrates with and without embedded metal grids are studied. The hybrid electrodes have an optical absorptance below 5% in the visible range and their electrical sheet resistance is less than 1 Omega/sq. The critical strain for tensile failure is analyzed through a combination of electrical measurements and in-situ observations of crack initiation and propagation during tensile loading. The mean critical strain for failure of the AZO/metal grid is 8.5% and that of the ZTO/metal grid is as high as 10%. The AZO and ZTO films alone present critical strain values around 0.6% and 1% respectively, demonstrating that the addition of the metal grid considerably improves the resistance onset strain of the electrodes far beyond these critical strain limits. (C) 2016 Elsevier B.V. All rights reserved.
000219506 6531_ $$aStretchable electrode
000219506 6531_ $$aAmorphous transparent conductive oxide
000219506 6531_ $$aMechanical test
000219506 6531_ $$aIndium-free
000219506 700__ $$uEcole Polytech Fed Lausanne, Inst Microengn IMT, Photovolta & Thin Film Elect Lab, 2002 Rue Maladiere 71, CH-2002 Neuchatel, Switzerland$$aDauzou, Fabien
000219506 700__ $$uHolst Ctr, High Tech Campus 31, NL-5656 AE Eindhoven, Netherlands$$aBouten, Piet C. P.
000219506 700__ $$0242061$$g174232$$uEcole Polytech Fed Lausanne, Inst Microengn IMT, Photovolta & Thin Film Elect Lab, 2002 Rue Maladiere 71, CH-2002 Neuchatel, Switzerland$$aDabirian, Ali
000219506 700__ $$0240315$$g105657$$aLeterrier, Yves
000219506 700__ $$g100192$$uEcole Polytech Fed Lausanne, Inst Microengn IMT, Photovolta & Thin Film Elect Lab, 2002 Rue Maladiere 71, CH-2002 Neuchatel, Switzerland$$aBallif, Christophe$$0243401
000219506 700__ $$aMorales-Masis, Monica$$uEcole Polytech Fed Lausanne, Inst Microengn IMT, Photovolta & Thin Film Elect Lab, 2002 Rue Maladiere 71, CH-2002 Neuchatel, Switzerland
000219506 773__ $$j35$$tOrganic Electronics$$q136-141
000219506 8564_ $$uhttps://infoscience.epfl.ch/record/219506/files/paper_865.pdf$$zPublisher's version$$s1742351$$yPublisher's version
000219506 909C0 $$xU10339$$0252013$$pLTC
000219506 909C0 $$pPV-LAB$$xU11963$$0252194
000219506 909CO $$qGLOBAL_SET$$pSTI$$particle$$ooai:infoscience.tind.io:219506
000219506 917Z8 $$x190055
000219506 917Z8 $$x148230
000219506 937__ $$aEPFL-ARTICLE-219506
000219506 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000219506 980__ $$aARTICLE