Noise Considerations in Low Vacuum Scanning Electron Microscopy
2007
Details
Title
Noise Considerations in Low Vacuum Scanning Electron Microscopy
Author(s)
Tileli, Vasiliki ; Toth, M. ; Knowles, R. ; Thiel, B. L.
Published in
Microscopy and Microanalysis
Volume
13
Issue
S02
Pages
1484-1485
Date
2007
Laboratories
INE
Record Appears in
Scientific production and competences > STI - School of Engineering > IMX - Institute of Materials > INE - Laboratory for in situ nanomaterials characterisation with electrons
Peer-reviewed publications
Work outside EPFL
Journal Articles
Published
Peer-reviewed publications
Work outside EPFL
Journal Articles
Published
Record creation date
2016-04-22