Deep-UV fluorescence lifetime imaging microscopy

A novel fluorescence lifetime imaging microscopy (FLIM) working with deep UV 240-280 nm wavelength excitations has been developed. UV-FLIM is used for measurement of defect-related fluorescence and its changes upon annealing from femtosecond laser-induced modifications in fused silica. This FLIM technique can be used with microfluidic and biosamples to characterize temporal characteristics of fluorescence upon UV excitation, a capability easily added to a standard microscope-based FLIM. UV-FLIM was tested to show annealing of the defects induced by silica structuring with ultrashort laser pulses. Frequency-domain fluorescence measurements were converted into the time domain to extract long fluorescence lifetimes from defects in silica. (C) 2015 Chinese Laser Press

Published in:
Photonics Research, 3, 5, 283-288
Washington, Optical Soc Amer

 Record created 2016-02-16, last modified 2018-03-17

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