Multicomponent wavefield characterization with a novel scanning laser interferometer

The in-plane component of the wavefield provides valuable information about media properties from seismology to nondestructive testing. A new compact scanning laser ultrasonic interferometer collects light scattered away from the angle of incidence to provide the absolute ultrasonic displacement for both the out-of-plane and an in-plane components. This new system is tested by measuring the radial and vertical polarization of a Rayleigh wave in an aluminum half-space. The estimated amplitude ratio of the horizontal and vertical displacement agrees well with the theoretical value. The phase difference exhibits a small bias between the two components due to a slightly different frequency response between the two processing channels of the prototype electronic circuitry. © 2010 American Institute of Physics.


Published in:
Review of Scientific Instruments, 81, 7, 073101
Year:
2010
Publisher:
American Institute of Physics
ISSN:
0034-6748
Laboratories:




 Record created 2015-10-30, last modified 2018-01-28


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