000210273 001__ 210273
000210273 005__ 20190317000228.0
000210273 0247_ $$2doi$$a10.1109/ISVLSI.2015.13
000210273 020__ $$a978-1-4799-8718-4
000210273 037__ $$aCONF
000210273 245__ $$aOn the Design of a Fault Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors
000210273 269__ $$a2015
000210273 260__ $$bIEEE$$c2015
000210273 336__ $$aConference Papers
000210273 520__ $$aThis paper first explores the effects of faults on circuits implemented with controllable-polarity transistors. We propose a new fault model that suits the characteristics of these devices, and report the results of a SPICE-based analysis of the effects of faults on the behavior of some basic gates implemented with them. Hence, we show that the considered devices are able to intrinsically tolerate a rather high number of faults. We finally exploit this property to build a robust and scalable adder whose area, performance and leakage power characteristics are improved by 15%, 18% and 12%, respectively, when compared to an equivalent FinFET solution at 22-nm technology node.
000210273 6531_ $$acontrollable-polarity transistors
000210273 6531_ $$afault model
000210273 6531_ $$afault tolerant adder
000210273 700__ $$aGhasemzadeh, Hassan
000210273 700__ $$aGaillardon, Pierre-Emmanuel
000210273 700__ $$0245831$$g212096$$aZhang, Jian
000210273 700__ $$0240269$$g167918$$aDe Micheli, Giovanni
000210273 700__ $$aSanchez, Eduardo$$g106339$$0241512
000210273 700__ $$aSonza Reorda, Matteo
000210273 7112_ $$dJuly 8-10, 2015$$cMontpellier, France$$aIEEE Computer Society Annual Symposium on VLSI (ISVLSI)
000210273 773__ $$tProceedings of the IEEE Computer Society Annual Symposium on VLSI (ISVLSI)$$q491-496
000210273 8564_ $$uhttps://infoscience.epfl.ch/record/210273/files/HGM_ISVLSI15.pdf$$zn/a$$s453974$$yn/a
000210273 909C0 $$xU11140$$0252283$$pLSI1
000210273 909CO $$pIC$$ooai:infoscience.tind.io:210273$$qGLOBAL_SET$$pconf$$pSTI
000210273 917Z8 $$x112915
000210273 917Z8 $$x112915
000210273 917Z8 $$x112915
000210273 937__ $$aEPFL-CONF-210273
000210273 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000210273 980__ $$aCONF