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Leakage mechanisms and contact technologies in InAlN/GaN high electron mobility transistors
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Leakage mechanisms and contact technologies in InA[...]
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Lugani, Lorenzo
- 6628
main
file(s):
EPFL_TH6628
version 1
EPFL_TH6628.pdf
[15.16 MB]
27 Jan 2018, 12:36
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