000206847 001__ 206847
000206847 005__ 20190812205828.0
000206847 020__ $$a978-1-4799-5238-0
000206847 0247_ $$2doi$$a10.1109/SusTech.2014.7046250
000206847 037__ $$aCONF
000206847 245__ $$aUnderstanding the Ageing Process, Recovering Phase and Fault Diagnosis of Electrochemical Double Layer Capacitors
000206847 269__ $$a2014
000206847 260__ $$bIEEE$$c2014$$aPortnald, USA
000206847 336__ $$aConference Papers
000206847 520__ $$aThis paper focuses on the description of the behavior of supercapacitors during over-temperature and over-voltage stresses and the consequent ageing processes. Specific physical evidences supporting the explanation of the experimental findings are provided and discussed in the paper. A method to distinguish between over-temperature and over-voltage post-faults of these storage devices is summarized and discussed. Additionally, new accelerated ageing phases and recovering phases are detected during combined high-pulsed Power Cycling and high-temperature Life endurance tests.
000206847 6531_ $$aSupercapacitors
000206847 6531_ $$aFault diagnosis
000206847 6531_ $$aAgeing
000206847 6531_ $$aRecovering phase
000206847 6531_ $$aAccelerated ageing
000206847 700__ $$0246334$$g223603$$aTorregrossa, Dimitri
000206847 700__ $$0245630$$g218483$$aToghill, Kathryn E.
000206847 700__ $$0242739$$g105258$$aGirault, Hubert
000206847 700__ $$aPaolone, Mario$$g156731$$0245463
000206847 7112_ $$dJuly 24-26, 2014$$cPortland, USA$$a2014 IEEE Conference on Technologies for Sustainability (SusTech)
000206847 720_1 $$aPerkins, Ed$$eed.
000206847 773__ $$j1$$tProc. of the 2014 IEEE Conference on Technologies for Sustainability (SusTech)$$k1$$q239-244
000206847 8564_ $$zPublisher's version$$yPublisher's version$$uhttps://infoscience.epfl.ch/record/206847/files/2014%20-%20Torregrossa%20et%20al%20-%20Ageing%20SC.pdf$$s666229
000206847 909C0 $$xU12494$$pDESL$$0252423
000206847 909C0 $$pLEPA$$0252090$$xU10100
000206847 909CO $$qGLOBAL_SET$$pconf$$pSTI$$pSB$$ooai:infoscience.tind.io:206847
000206847 917Z8 $$x156731
000206847 937__ $$aEPFL-CONF-206847
000206847 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000206847 980__ $$aCONF