000203279 001__ 203279
000203279 005__ 20180913062840.0
000203279 0247_ $$2doi$$a10.1111/jmi.12034
000203279 022__ $$a00222720
000203279 037__ $$aARTICLE
000203279 245__ $$aEBSD coupled to SEM in situ annealing for assessing recrystallization and grain growth mechanisms in pure tantalum
000203279 260__ $$c2013
000203279 269__ $$a2013
000203279 336__ $$aJournal Articles
000203279 520__ $$aAn in situ annealing stage has been developed in-house and integrated in the chamber of a Scanning Electron Microscope equipped with an Electron BackScattered Diffraction system. Based on the Joule effect, this device can reach the temperature of 1200°C at heating rates up to 100°C/s, avoiding microstructural evolutions during heating. A high-purity tantalum deformed sample has been annealed at variable temperature in the range 750°C-1030°C, and classical mechanisms of microstructural evolutions such as recrystallization and grain coarsening phenomena have been observed. Quantitative measurements of grain growth rates provide an estimate of the mean grain boundary mobility, which is consistent with the value estimated from physical parameters reported for that material. In situ annealing therefore appears to be suited for complementing bulk measurements at relatively high temperatures, in the context of recrystallization and grain growth in such a single-phase material. © 2013 The Authors Journal of Microscopy © 2013 Royal Microscopical Society.
000203279 6531_ $$aarticle
000203279 6531_ $$acrystallization
000203279 6531_ $$aEBSD
000203279 6531_ $$aelectron back scattered diffraction
000203279 6531_ $$aelectron diffraction
000203279 6531_ $$agrain
000203279 6531_ $$aGrain boundary mobility
000203279 6531_ $$aGrain growth
000203279 6531_ $$agrowth
000203279 6531_ $$agrowth rate
000203279 6531_ $$aheating
000203279 6531_ $$ain situ
000203279 6531_ $$amolecular evolution
000203279 6531_ $$anonhuman
000203279 6531_ $$aphysical parameters
000203279 6531_ $$apriority journal
000203279 6531_ $$aquantitative analysis
000203279 6531_ $$ascanning electron microscopy
000203279 6531_ $$aStatic recrystallization
000203279 6531_ $$aTantalum
000203279 6531_ $$atemperature
000203279 700__ $$aKerisit, C.
000203279 700__ $$0248074$$aLogé, R.E.$$g243441
000203279 700__ $$aJacomet, S.
000203279 700__ $$aLlorca, V.
000203279 700__ $$aBozzolo, N.
000203279 773__ $$j250$$q189-199$$tJournal of Microscopy
000203279 909C0 $$0252516$$pLMTM$$xU12903
000203279 909CO $$ooai:infoscience.tind.io:203279$$pSTI$$particle
000203279 937__ $$aEPFL-ARTICLE-203279
000203279 973__ $$aOTHER$$rREVIEWED$$sPUBLISHED
000203279 980__ $$aARTICLE