000202856 001__ 202856
000202856 005__ 20181203023641.0
000202856 0247_ $$2doi$$a10.1016/j.actamat.2005.10.038
000202856 022__ $$a1359-6454
000202856 037__ $$aARTICLE
000202856 245__ $$aFracture in confined thin films: A discrete dislocation study
000202856 260__ $$c2006
000202856 269__ $$a2006
000202856 336__ $$aJournal Articles
000202856 520__ $$aThe fracture toughness of thin metal films confined between elastic layers is studied using a two-dimensional discrete dislocation (DD) method. Fracture along the metal/substrate interface is permitted through the use of a cohesive zone model. The predicted fracture toughness versus film thickness is in good agreement with experimental data for the Cu/TaN/SiO2/Si system. The predicted 0.2%-offset yield stress also agrees with values derived by fitting a continuum plasticity model to the experimental fracture data. The effects of intrinsic interface fracture energy, mode mixity of the loading, and fracture away from the metal/substrate interface are investigated to capture effects present in the experiments. Overall, the results show that the contribution of plastic dissipation to interfacial fracture toughness may be qualitatively predicted using the DD framework and that the DD framework can rationalize experimentally observed size effects under different loading conditions with no ad hoc assumption of the constitutive behavior. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
000202856 6531_ $$aComputer simulation
000202856 6531_ $$acrack-growth
000202856 6531_ $$aDislocations
000202856 6531_ $$aelastic-plastic solids
000202856 6531_ $$ainterface
000202856 6531_ $$alayer
000202856 6531_ $$amechanical properties - fracture
000202856 6531_ $$amodel
000202856 6531_ $$aplastic
000202856 6531_ $$aresistance
000202856 6531_ $$astress
000202856 6531_ $$athin films
000202856 6531_ $$atoughness
000202856 700__ $$aChng, A. C.
000202856 700__ $$aO'Day, M. P.
000202856 700__ $$0246474$$g211624$$aCurtin, W. A.
000202856 700__ $$aTay, A. O.
000202856 700__ $$aLim, K. M.
000202856 773__ $$j54$$tActa Materialia$$q1017-1027
000202856 909C0 $$xU12614$$0252513$$pLAMMM
000202856 909CO $$pSTI$$particle$$ooai:infoscience.tind.io:202856
000202856 937__ $$aEPFL-ARTICLE-202856
000202856 970__ $$achng_fracture_2006/LAMMM
000202856 973__ $$rREVIEWED$$sPUBLISHED$$aOTHER
000202856 980__ $$aARTICLE