Lateral shearing interferometry of high-harmonic wavefronts

We present a technique for frequency-resolved wavefront characterization of high harmonics based on lateral shearing interferometry. Tilted replicas of the driving laser pulse are produced by a Mach-Zehnder interferometer, producing separate focii in the target. The interference of the resulting harmonics on a flat-field extreme ultraviolet spectrometer yields the spatial phase derivative. A comprehensive set of spatial profiles, resolved by harmonic order, validate the technique and reveal the interplay of single-atom and macroscopic effects. © 2011 Optical Society of America.


Published in:
Optics Letters, 36, 10, 1746
Year:
2011
ISSN:
1539-4794
Laboratories:




 Record created 2014-10-29, last modified 2018-01-28


Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)