Reliability of packaging in high-temperature control electronics


Advisor(s):
Ryser, Peter
Maeder, Thomas
Year:
2014
Publisher:
Lausanne, EPFL
Keywords:
Other identifiers:
urn: urn:nbn:ch:bel-epfl-thesis6297-9
Laboratories:


Note: The status of this file is: EPFL only


 Record created 2014-09-15, last modified 2018-09-13

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