000200361 001__ 200361
000200361 005__ 20190316235945.0
000200361 0247_ $$2doi$$a10.1007/s13361-014-0914-z
000200361 022__ $$a1879-1123
000200361 02470 $$2ISI$$a000339807400007
000200361 037__ $$aARTICLE
000200361 245__ $$aA ToF-MS with a Highly Efficient Electrostatic Ion Guide for Characterization of Ionic Liquid Electrospray Sources
000200361 269__ $$a2014
000200361 260__ $$bSpringer$$c2014$$aNew York
000200361 300__ $$a10
000200361 336__ $$aJournal Articles
000200361 520__ $$aWe report on the development of a time-of-flight (ToF) mass spectrometer with a highly efficient electrostatic ion guide for enhancing detectability in ToF mass spectrometry. This 65-cm long ion guide consists of 13 cascaded stages of Einzel lens to collect a large fraction of emitted charges over a wide emission angle and energy spread for time-of-flight measurements. Simulations show that the ion guide can collect 100% of the charges with up to 23° emission half-angle or 30% energy spread irrespective of their specific charge. We demonstrate this ion guide as applied to electrospray ion sources. Experiments performed with tungsten needle electrospraying the ionic liquid EMI- BF4 showed that up to 80% of the emitted charges could be collected at the end of the flight tube. Flight times of monomers and dimers emitted from the needles were measured in both positive and negative emission polarities. The setup was also used to characterize the electrospray from° microfabricated silicon capillary emitters and nearly 30% charges could be collected even from a 40 emission half-angle. This setup can thus increase the fraction of charge collection for ToF measurement and spray characteristics can be obtained from a very large fraction of the emission in real time.
000200361 6531_ $$aMass spectrometry
000200361 6531_ $$aElectrostatic lens
000200361 6531_ $$aIon guide
000200361 700__ $$0245389$$g207349$$aChakraborty, Subha
000200361 700__ $$aAtaman, Caglar
000200361 700__ $$aCourtney, Daniel G.
000200361 700__ $$0244609$$g203360$$aDandavino, Simon
000200361 700__ $$aShea, Herbert$$g162368$$0240376
000200361 773__ $$j25$$tJournal of The American Society for Mass Spectrometry$$k8$$q1364-1373
000200361 8564_ $$uhttp://www.springer.com/alert/urltracking.do?id=L5317debMfbcfd0Sb0f3e35$$zURL
000200361 8564_ $$uhttps://infoscience.epfl.ch/record/200361/files/Subha%20tof-ms%20ion%20guide.pdf$$zPublisher's version$$s1793642$$yPublisher's version
000200361 909C0 $$xU10955$$0252107$$pLMTS
000200361 909CO $$qGLOBAL_SET$$pSTI$$ooai:infoscience.tind.io:200361$$particle
000200361 917Z8 $$x162368
000200361 917Z8 $$x162368
000200361 917Z8 $$x162368
000200361 937__ $$aEPFL-ARTICLE-200361
000200361 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000200361 980__ $$aARTICLE