000200350 001__ 200350
000200350 005__ 20181203023540.0
000200350 0247_ $$2doi$$a10.1063/1.4890090
000200350 022__ $$a1077-3118
000200350 02470 $$2ISI$$a000341151400090
000200350 037__ $$aARTICLE
000200350 245__ $$aTwo-dimensional ultra-small angle X-ray scattering with grating interferometry
000200350 260__ $$bAmer Inst Physics$$c2014$$aMelville
000200350 269__ $$a2014
000200350 300__ $$a4
000200350 336__ $$aJournal Articles
000200350 520__ $$aIt was recently established that the pixel-wise ultra-small angle x-ray distribution can be retrieved with grating interferometry. However, in these one dimensional approaches the contrast was limited to the direction orthogonal to the structure of the line gratings. Here, we demonstrate that sensitivity in two contrast directions can be achieved by using two pairs of crossed line gratings and by adapting scan procedures and data analysis accordingly. We demonstrate the retrieval of two-dimensional scattering distributions with grating interferometry, thus overcoming the previously reported limit of seven obtainable, complementary contrasts. In addition, we give further evidence for the superiority of the signal-to-noise ratio for the dark-field contrast, if a deconvolution-based instead of the standard analysis is utilized.
000200350 6531_ $$aCIBM-PC
000200350 700__ $$0247339$$g235556$$aModregger, P.
000200350 700__ $$aRutishauser, S.
000200350 700__ $$aMeiser, J.
000200350 700__ $$aDavid, C.
000200350 700__ $$aStampanoni, M.
000200350 773__ $$j105$$tApplied Physics Letters$$k2$$q024102
000200350 909C0 $$xU12623$$0252477$$pCIBM
000200350 909CO $$pSB$$particle$$ooai:infoscience.tind.io:200350
000200350 917Z8 $$x161735
000200350 937__ $$aEPFL-ARTICLE-200350
000200350 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000200350 980__ $$aARTICLE