Leak rate and reliability of low temperature thin-film indium bonding
2013
Details
Title
Leak rate and reliability of low temperature thin-film indium bonding
Author(s)
Straessle, R. ; Pétremand, Y. ; Briand, D. ; de Rooij, N. F.
Published in
Proceedings of Transducers 2013
Volume
1
Pages
814-817
Conference
Transducers 2013, Barcelona, Spain, June 17-20, 2013
Date
2013
Laboratories
SAMLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > SAMLAB - Sensors, Actuators and Microsystems Laboratory
Conference Papers
Work produced at EPFL
Published
Conference Papers
Work produced at EPFL
Published
Record creation date
2014-04-23