000198396 001__ 198396
000198396 005__ 20190812205745.0
000198396 020__ $$a978-1-61499-353-7
000198396 0247_ $$2doi$$a10.3233/978-1-61499-354-4-227
000198396 022__ $$a1383-7281
000198396 02470 $$2ISI$$a000332260700027
000198396 037__ $$aCONF
000198396 245__ $$aCharacterization of Surface Cracks Through The Local Magnetic Field Induced by Eddy Currents
000198396 260__ $$bIos Press$$c2014$$aAmsterdam
000198396 269__ $$a2014
000198396 300__ $$a11
000198396 336__ $$aConference Papers
000198396 490__ $$aStudies in Applied Electromagnetics and Mechanics
000198396 520__ $$aIt is important to reliably characterize cracks in metallic mechanical parts in order to assess the serenity of damage due to fatigue. The most important parameter for this is the crack depth. This is notoriously difficult with standard Eddy current techniques. We show here that this can be achieved by measuring the local magnetic field induced by Eddy currents flowing around the crack. This is done by using a high-density array of micro-Hall sensors integrated in a single CMOS chip with a spatial resolution of 10 mu m. We present the dependence of the signal on varying crack depths, liftoff and yaw angle. Finally, we study the response of the sensor to cracks in a DC magnetic field, i.e. the flux leakage due to the presence of a crack. This is especially relevant to cases where cracks appear predominantly close to edges with complex geometries for which it is difficult to induce clean Eddy currents.
000198396 6531_ $$aEddy current testing
000198396 6531_ $$amagnetic camera
000198396 6531_ $$aline sensor
000198396 700__ $$aHippert, David
000198396 700__ $$aSanti, Gilles
000198396 700__ $$aKejik, Pavel
000198396 700__ $$aPicasso, Marco
000198396 700__ $$aRevaz, Bernard
000198396 700__ $$0241084$$g102772$$aMoser, Roland
000198396 700__ $$0240027$$g104561$$aBleuler, Hannes
000198396 7112_ $$a17th International Workshop on Electromagnetic Nondestructive Evaluation, 17th International Workshop on Electromagnetic Nondestructive Evaluation
000198396 720_1 $$aRebello, Jma$$eed.
000198396 720_1 $$aKojima, F$$eed.
000198396 720_1 $$aChady, T$$eed.
000198396 773__ $$j38$$tElectromagnetic Nondestructive Evaluation (Xvi)$$q227-237
000198396 909C0 $$pLSRO$$0252016
000198396 909CO $$ooai:infoscience.tind.io:198396$$pconf$$pSTI
000198396 917Z8 $$x144315
000198396 917Z8 $$x144315
000198396 917Z8 $$x144315
000198396 917Z8 $$x104561
000198396 937__ $$aEPFL-CONF-198396
000198396 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000198396 980__ $$aCONF