000198072 001__ 198072
000198072 005__ 20190316235905.0
000198072 0247_ $$2doi$$a10.1007/s00446-013-0199-7
000198072 022__ $$a0178-2770
000198072 02470 $$2ISI$$a000330991500004
000198072 037__ $$aARTICLE
000198072 245__ $$aTolerating permanent and transient value faults
000198072 269__ $$a2014
000198072 260__ $$bSpringer Verlag$$c2014$$aNew York
000198072 300__ $$a23
000198072 336__ $$aJournal Articles
000198072 520__ $$aTransmission faults allow us to reason about permanent and transient value faults in a uniform way. However, all existing solutions to consensus in this model are either in the synchronous system, or require strong conditions for termination, that exclude the case where all messages of a process can be corrupted. In this paper we introduce eventual consistency in order to overcome this limitation. Eventual consistency denotes the existence of rounds in which processes receive the same set of messages. We show how eventually consistent rounds can be simulated from eventually synchronous rounds, and how eventually consistent rounds can be used to solve consensus. Depending on the nature and number of permanent and transient transmission faults, we obtain different conditions on , the number of processes, in order to solve consensus in our weak model.
000198072 6531_ $$aConsensus
000198072 6531_ $$aTransmission faults
000198072 6531_ $$aArbitrary faults
000198072 6531_ $$aStatic and dynamic faults
000198072 6531_ $$aTransient and permanent faults
000198072 6531_ $$aEventual consistency
000198072 700__ $$0243466$$g173713$$uEcole Polytech Fed Lausanne, CH-1015 Lausanne, Switzerland$$aMilosevic, Zarko
000198072 700__ $$0243462$$g172802$$aHutle, Martin
000198072 700__ $$aSchiper, Andre$$uEcole Polytech Fed Lausanne, CH-1015 Lausanne, Switzerland$$g106377$$0241767
000198072 773__ $$j27$$tDistributed Computing$$k1$$q55-77
000198072 8564_ $$uhttps://infoscience.epfl.ch/record/198072/files/paper-dc.pdf$$zn/a$$s544359$$yn/a
000198072 909C0 $$xU10411$$0252206$$pLSR
000198072 909CO $$qGLOBAL_SET$$pIC$$ooai:infoscience.tind.io:198072$$particle
000198072 917Z8 $$x106377
000198072 937__ $$aEPFL-ARTICLE-198072
000198072 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000198072 980__ $$aARTICLE