A 120 dB dynamic-range radiation-tolerant charge-to-digital converter for radiation monitoring

We present a radiation-tolerant 120 dB dynamic-range interface circuit for ionization chambers and diamond detectors. The device consists of a multi-scale continuous-time incremental charge-to-digital converter paired with a temperature-compensated current reference. The circuit selects the sensitivity according to the input signal level and provides a 20-bit plus sign output code every 40 mu s. The proposed interface circuit achieves a measurement linearity error better than +/- 5% in the 40 fC-42 nC range. The ASIC has been designed for radiation-tolerance in a 0.25 mu m 3M1P CMOS technology and tested for TID up to 100 kGy(Si), showing uninterrupted functionality. The conversion reference drifts of 3% at 100 kGy(Si) and its temperature coefficient is less than 600 ppm/degrees C. (C) 2013 Elsevier Ltd. All rights reserved.


Published in:
Microelectronics Journal, 44, 12, 1302-1308
Year:
2013
Publisher:
Oxford, Elsevier
ISSN:
0026-2692
Keywords:
Laboratories:




 Record created 2014-02-17, last modified 2018-09-13


Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)