A Fast and Parallel Stroud-Based Stochastic Collocation Method for Statistical EMI/EMC Analysis
A fast and parallel Stroud-based stochastic collocation method for statistically characterizing electromagnetic interference and compatibility (EMI/EMC) phenomena on loaded multiscale platforms with uncertain system configurations and subject to variable electromagnetic excitations is described. The proposed method uses a previously developed hybrid time domain integral equation based field-cable-circuit to carry out deterministic EMI/EMC simulations permitting the statistical characterization of pertinent observables. The number of simulations required by the proposed method is far fewer than those needed by Monte-Carlo methods. The proposed method is used to characterize cable-induced coupling onto PC cards located in shielding enclosures. Both the hybrid simulator and the stochastic collocation code execute with near-full efficiency on distributed memory clusters.
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Keywords: electromagnetic interference and compatibility ; stochastic collocation ; Stroud integration rules ; electromagnetic coupling ; time domain integral equations ; hybrid solvers ; fast solvers ; parallelization
IEEE International Symposium on Electromagnetic Compatibility, Detroit, MI, AUG 18-22, 2008
Record created on 2013-11-12, modified on 2016-08-09