A Fast and Parallel Stroud-Based Stochastic Collocation Method for Statistical EMI/EMC Analysis

A fast and parallel Stroud-based stochastic collocation method for statistically characterizing electromagnetic interference and compatibility (EMI/EMC) phenomena on loaded multiscale platforms with uncertain system configurations and subject to variable electromagnetic excitations is described. The proposed method uses a previously developed hybrid time domain integral equation based field-cable-circuit to carry out deterministic EMI/EMC simulations permitting the statistical characterization of pertinent observables. The number of simulations required by the proposed method is far fewer than those needed by Monte-Carlo methods. The proposed method is used to characterize cable-induced coupling onto PC cards located in shielding enclosures. Both the hybrid simulator and the stochastic collocation code execute with near-full efficiency on distributed memory clusters.


Published in:
2008 IEEE International Symposium on Electromagnetic Compatibility (EMC), vols 1-3, 790-794
Presented at:
2008 IEEE International Symposium on Electromagnetic Compatibility (EMC), 345 E 47th St, NewYork,NY 10017 USA
Year:
2008
Publisher:
IEEE
ISBN:
978-1-4244-1699-8
Keywords:
Note:
IEEE International Symposium on Electromagnetic Compatibility, Detroit, MI, AUG 18-22, 2008
Laboratories:




 Record created 2013-11-12, last modified 2018-03-17


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