000189785 001__ 189785
000189785 005__ 20181205220231.0
000189785 0247_ $$2doi$$a10.5075/epfl-thesis-5949
000189785 02470 $$2urn$$aurn:nbn:ch:bel-epfl-thesis5949-8
000189785 02471 $$2nebis$$a9964974
000189785 037__ $$aTHESIS
000189785 041__ $$aeng
000189785 088__ $$a5949
000189785 245__ $$aTransmission Electron Microscopy and Nanoindentation Studies of Ultrathin Transition Metal Dichalcogenide Semiconductor Membranes
000189785 269__ $$a2013
000189785 260__ $$aLausanne$$bEPFL$$c2013
000189785 336__ $$aTheses
000189785 502__ $$aM.Q. Tran (président), D.T. L. Alexander, R. Erni, J.-L. Rouvière
000189785 6531_ $$aTransition metal dichalcogenide
000189785 6531_ $$aMoS2
000189785 6531_ $$aMoSe2
000189785 6531_ $$atransmission electron microscopy
000189785 6531_ $$aelectron diffraction
000189785 6531_ $$ain-situ electrical characterization
000189785 6531_ $$ananoindentation
000189785 6531_ $$amicro-fabrication
000189785 700__ $$0244323$$aBrivio, Jacopo$$g197116
000189785 720_2 $$0240306$$aKis, Andras$$edir.$$g133331
000189785 8564_ $$s72340003$$uhttps://infoscience.epfl.ch/record/189785/files/EPFL_TH5949.pdf$$yn/a$$zn/a
000189785 909C0 $$0252294$$pLANES$$xU11840
000189785 909CO $$ooai:infoscience.tind.io:189785$$pthesis-bn2018$$pDOI$$pSTI$$pthesis$$qDOI2
000189785 917Z8 $$x108898
000189785 917Z8 $$x108898
000189785 917Z8 $$x108898
000189785 918__ $$aSTI$$cIEL$$dEDPY
000189785 919__ $$aLANES
000189785 920__ $$a2013-10-11$$b2013
000189785 970__ $$a5949/THESES
000189785 973__ $$aEPFL$$sPUBLISHED
000189785 980__ $$aTHESIS