000189111 001__ 189111
000189111 005__ 20181203023246.0
000189111 0247_ $$2doi$$a10.1103/PhysRevB.87.205417
000189111 022__ $$a1098-0121
000189111 02470 $$2ISI$$a000318810300007
000189111 037__ $$aARTICLE
000189111 245__ $$aExperimental visualization of scattering at defects in electronic transport through a single atomic junction
000189111 260__ $$bAmer Physical Soc$$c2013$$aCollege Pk
000189111 269__ $$a2013
000189111 300__ $$a6
000189111 336__ $$aJournal Articles
000189111 520__ $$aFor electronic transport at the nanoscale, coherent scattering at defects plays an important role. Therefore, the capability of visualizing the influence of defects on the conductivity of single atomic junctions may benefit the development of future nano-electronics. Here, we report imaging the coherent scattering from a defect with well-controlled geometry by quantum point contact microscopy recently developed by us. An similar to 10% modulation in transport conductance of a single atomic junction is observed, with a phase shift of nearly p compared to the tunneling conductance. With the well-defined scattering geometry, we performed a theoretical calculation of the conductance and found the result consistent with the experiment.
000189111 700__ $$uMax Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany$$aZhang, Yong-Hui
000189111 700__ $$uMax Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany$$aWahl, Peter
000189111 700__ $$g105546$$uMax Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany$$aKern, Klaus$$0240038
000189111 773__ $$j87$$tPhysical Review B$$k20
000189111 909C0 $$xU10152$$0252366$$pLSEN
000189111 909CO $$pSB$$particle$$ooai:infoscience.tind.io:189111
000189111 937__ $$aEPFL-ARTICLE-189111
000189111 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000189111 980__ $$aARTICLE