Piezoresistive Ni:a-C:H thin films containing hcp-Ni or Ni3C investigated by XRD, EXAFS, and wavelet analysis
2013
Details
Title
Piezoresistive Ni:a-C:H thin films containing hcp-Ni or Ni3C investigated by XRD, EXAFS, and wavelet analysis
Author(s)
Uhlig, Steffen ; Struis, Rudolf ; Schmid-Engel, Hanna ; Bock, Jochen ; Probst, Anne-Catherine ; Freitag-Weber, Olivia ; Zizak, Ivo ; Chernikov, Roman ; Schultes, Günter
Published in
Diamond and Related Materials
Volume
34
Pages
25-35
Date
2013
Publisher
Elsevier
ISSN
0925-9635
Laboratories
EPFL-PSI
Record Appears in
Scientific production and competences > ENAC - School of Architecture, Civil and Environmental Engineering > IIE - Environmental Engineering Institute > EPFL-PSI - Joint Professorship on Solid Waste Treatment
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2013-07-20