Piezoresistive Ni:a-C:H thin films containing hcp-Ni or Ni3C investigated by XRD, EXAFS, and wavelet analysis


Published in:
Diamond and Related Materials, 34, 25-35
Year:
2013
Publisher:
Elsevier
ISSN:
0925-9635
Laboratories:




 Record created 2013-07-20, last modified 2018-01-28


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