X-ray bright-field imaging analyzes crystalline quality and defects of SiC wafers
2007
Details
Title
X-ray bright-field imaging analyzes crystalline quality and defects of SiC wafers
Author(s)
Yi, J. M. ; Chu, Y. S. ; Zhong, Y. ; Je, J. H. ; Hwu, Y. ; Margaritondo, G.
Published in
Journal of Applied Crystallography
Volume
40
Issue
2
Pages
376-378
Date
2007
Publisher
International Union of Crystallography
ISSN
0021-8898
Keywords
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > SB Archives > LPRX - X-Ray Physics Laboratory
Scientific production and competences > SB - School of Basic Sciences > CIBM - Biomedical Imaging Research Center
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Scientific production and competences > SB - School of Basic Sciences > CIBM - Biomedical Imaging Research Center
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2013-04-25