X-ray bright-field imaging analyzes crystalline quality and defects of SiC wafers


Published in:
Journal of Applied Crystallography, 40, 2, 376-378
Year:
2007
Publisher:
International Union of Crystallography
ISSN:
0021-8898
Keywords:
Laboratories:




 Record created 2013-04-25, last modified 2018-09-13


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