Evaluation of the BSIM6 compact MOSFET model's scalability in 40nm CMOS technology


Published in:
2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC), 50-53
Presented at:
ESSDERC 2012 - 42nd European Solid State Device Research Conference, Bordeaux, France, 17-21 09 2012
Year:
2012
Publisher:
IEEE
Laboratories:




 Record created 2013-03-27, last modified 2018-01-28


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