High throughput screening platform for ultra large scale integration based on high-k silicon nanowire ISFET and 3D integration


Advisor(s):
Leblebici, Yusuf
Year:
2013
Publisher:
Lausanne, EPFL
Keywords:
Other identifiers:
urn: urn:nbn:ch:bel-epfl-thesis5660-3
Laboratories:


Note: The status of this file is: EPFL only


 Record created 2013-03-07, last modified 2018-05-01

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