000184576 001__ 184576
000184576 005__ 20190812205655.0
000184576 0247_ $$2doi$$a10.1109/Tasc.2011.2178990
000184576 02470 $$2ISI$$a000307364700277
000184576 037__ $$aCONF
000184576 245__ $$aExamination of Japanese Mass-Produced Nb3Sn Conductors for ITER Toroidal Field Coils
000184576 269__ $$a2012
000184576 260__ $$bIEEE-Inst Electrical Electronics Engineers Inc$$c2012$$aPiscataway
000184576 300__ $$a4
000184576 336__ $$aConference Papers
000184576 520__ $$aThe performances of six Nb3Sn conductors for the ITER Toroidal Field coils were tested. Four of them showed similar degradation rates of their current sharing temperatures T-cs over 1,000 electromagnetic cycles. By contrast, two of them showed sharp T-cs degradations at 50 cycles, after which their slopes became similar to those of the other four conductors. These two cables seemed to shrink under high magnetic fields during the first 50 cycles, which caused the sharp T-cs degradation. This shrinkage might arise from a decline in cable rigidity due to, for example, the deformation of strands or the breakage of the Nb3Sn filaments. The four mass-produced conductors had roughly the same AC loss before cycling. After 1,000 cycles, the AC losses of all the conductors decreased markedly to less than half of those before cycling, and the values became approximately the same. After the test campaign, the destructive inspection of two of the conductors made it clear that the conductor had shrunk by about 520 ppm under the high magnetic field during the test. It was also clarified that some strands were visibly deformed under the high magnetic field, whereas those under the low magnetic field did not look distorted. This plastic deformation of the strands could be one of the major reasons for the T-cs degradation with cyclic operation.
000184576 6531_ $$aFusion reactors
000184576 6531_ $$amultifilamentary superconductors
000184576 6531_ $$asuperconducting coils
000184576 6531_ $$atoroidal magnetic fields
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aNabara, Y.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aNunoya, Y.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aIsono, T.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aHamada, K.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aTakahashi, Y.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aMatsui, K.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aHemmi, T.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aKawano, K.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aKoizumi, N.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aEbisawa, N.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aIguchi, M.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aKajitani, H.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aOshikiri, M.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aUno, Y.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aTsutsumi, F.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aYoshikawa, M.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aNakajima, H.
000184576 700__ $$uJapan Atom Energy Agcy, Naka, Ibaraki 3110193, Japan$$aOkuno, K.
000184576 700__ $$aBruzzone, P.
000184576 700__ $$aStepanov, B.
000184576 7112_ $$dSeptember 12-16, 2011$$cMarseille$$a22nd International Conference on Magnet Technology (MT)
000184576 773__ $$j22$$tIEEE Transactions On Applied Superconductivity$$k3
000184576 909C0 $$pCRPP
000184576 909C0 $$pSPC$$0252028$$xU10136$$xU12267$$xU12269$$xU12271$$xU10559$$xU12273$$xU10557$$xU12270$$xU10137$$xU10636$$xU12266$$xU10635$$xU10558$$xU12268$$xU12272
000184576 909CO $$pconf$$pSB$$ooai:infoscience.tind.io:184576
000184576 917Z8 $$x105317
000184576 917Z8 $$x112823
000184576 937__ $$aEPFL-CONF-184576
000184576 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000184576 980__ $$aCONF