Enhanced Wafer Matching Heuristics for 3-D ICs
2012
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Details
Title
Enhanced Wafer Matching Heuristics for 3-D ICs
Author(s)
Pavlidis, Vasileios ; Xu, Hu ; De Micheli, Giovanni
Published in
Proceedings of the IEEE 17th European Test Symposium
Pagination
1
Series
Proceedings of the European Test Symposium
Pages
178
Conference
IEEE 17th European Test Symposium, Annecy, France, May 28- June 1, 2012
Date
2012
Publisher
New York, Ieee
ISBN
978-1-4673-0697-3
Other identifier(s)
View record in Web of Science
Laboratories
LSI1
Record Appears in
Scientific production and competences > I&C - School of Computer and Communication Sciences > IINFCOM > LSI1 - Integrated Systems Laboratory 1 (STI/IC)
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2012-07-20