A completely scalable lumped-circuit model for horizontal and vertical HALL devices

A completely scalable lumped-circuit model for horizontal and vertical HALL devices is presented therein that can be efficiently implemented in SPICE-like EDA simulators. The model has been employed for the quantitative analysis of. a) geometrical, b) temperature, and c) field-dependent mobility effects, as well as for d) the dynamic response and e) the noise behavior of several HALL sensors. A series of experimental data is presented along with simulation results.


Published in:
2007 Ieee Sensors, Vols 1-3, 337-340
Presented at:
6th IEEE Sensors Conference, Atlanta, GA, Oct 28-31, 2007
Year:
2007
Publisher:
Ieee Service Center, 445 Hoes Lane, Po Box 1331, Piscataway, Nj 08855-1331 Usa
ISBN:
978-1-4244-1261-7
Laboratories:




 Record created 2012-07-04, last modified 2018-09-13


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