000179749 001__ 179749
000179749 005__ 20180317094303.0
000179749 020__ $$a978-0-8194-6758-4
000179749 02470 $$2ISI$$a000251243000036
000179749 037__ $$aCONF
000179749 245__ $$aReal-time dual-wavelength digital holographic microscopy with a single hologram - art. no. 661615
000179749 260__ $$bSpie-Int Soc Optical Engineering, Po Box 10, Bellingham, Wa 98227-0010 Usa$$c2007
000179749 269__ $$a2007
000179749 336__ $$aConference Papers
000179749 490__ $$aProceedings Of The Society Of Photo-Optical Instrumentation Engineers (Spie)
000179749 520__ $$aWe report on a method to achieve real-time dual-wavelength digital holographic microscopy with a single hologram acquisition. By recording both interferograms from two laser sources at different wavelengths in only one spatially-multiplexed digital hologram, we are able to independently propagate and apply numerical corrections on both wavefronts in order to obtain a beat-wavelength phase map of the specimen. This beat-wavelength being up to 10-100 times larger than the original wavelengths, we are in a situation where the 27 pi phase ambiguity of conventional DHM is removed and the phase measurement range of the technique is extended up to several tens of microns in height. The unique capability to perform such an operation with a single acquisition unables real-time dual-wavelength DHM measurements. Results on a moving micro-mirror are presented in this paper. We think that such a real-time dual-wavelength method represents a strong improvement to the current DHM state-of-the-art, and that it opens a whole new field of applications for this technique.
000179749 6531_ $$adigital holography
000179749 6531_ $$adual-wavelength
000179749 6531_ $$atwo-wavelengths
000179749 6531_ $$abeat-wavelength
000179749 6531_ $$amicroscopy
000179749 6531_ $$aWavefront Reconstruction
000179749 6531_ $$aNumerical Reconstruction
000179749 6531_ $$aAberration Compensation
000179749 6531_ $$aContrast
000179749 6531_ $$aObjects
000179749 700__ $$aKuehn, Jonas
000179749 700__ $$0240771$$aColomb, Tristan$$g100884
000179749 700__ $$aMontfort, Frederic
000179749 700__ $$0240472$$aCharriere, Florian$$g119924
000179749 700__ $$0240009$$aDepeursinge, Christian$$g104931
000179749 7112_ $$aConference on Optical Measurement Systems for Industrial Inspection V$$cMunich, GERMANY$$dJun 18-22, 2007
000179749 773__ $$j6616$$q61615-61615$$tOptical Measurement Systems For Industrial Inspection V, Pts 1 And 2
000179749 909CO $$ooai:infoscience.tind.io:179749$$pSTI$$pconf
000179749 909C0 $$0252008$$pLOA$$xU10346
000179749 917Z8 $$x136609
000179749 937__ $$aEPFL-CONF-179749
000179749 973__ $$aEPFL$$rNON-REVIEWED$$sPUBLISHED
000179749 980__ $$aCONF