Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process
2011
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Details
Title
Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process
Author(s)
Veerappan, C. ; Richardson, J. ; Walker, R. ; Li, D. U. ; Fishburn, M. W. ; Stoppa, D. ; Borghetti, F. ; Maruyama, Y. ; Gersbach, M. ; Henderson, R. K. ; Bruschini, C. ; Charbon, E.
Published in
Proc. IEEE European Solid-State Electron Device Conference (ESSDERC)
Pages
331-334
Conference
IEEE European Solid-State Electron Device Conference (ESSDERC), September, 2011
Date
2011
Laboratories
AQUA
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > AQUA - Quantum Architecture Group
Scientific production and competences > EPFL Partners > Neuchâtel Campus > AQUA - Quantum Architecture Group
Peer-reviewed publications
Work outside EPFL
Conference Papers
Scientific production and competences > EPFL Partners > Neuchâtel Campus > AQUA - Quantum Architecture Group
Peer-reviewed publications
Work outside EPFL
Conference Papers
Record creation date
2012-06-12