On the Exploitation of the Inherent Error Resilience of Wireless Systems under Unreliable Silicon

In this paper, we investigate the impact of circuit misbehavior due to parametric variations and voltage scaling on the performance of wireless communication systems. Our study reveals the inherent error resilience of such systems and argues that sufficiently reliable operation can be maintained even in the presence of unreliable circuits and manufacturing defects. We further show how selective application of more robust circuit design techniques is sufficient to deal with high defect rates at low overhead and improve energy efficiency with negligible system performance degradation.


Published in:
2012 49Th Acm/Edac/Ieee Design Automation Conference (Dac), 510-515
Presented at:
IEEE Design Automation Conference (DAC), San Francisco, June 3-7, 2012
Year:
2012
Publisher:
New York, Ieee
ISSN:
0738-100X
ISBN:
978-1-4503-1199-1
Keywords:
Laboratories:




 Record created 2012-05-09, last modified 2018-03-17

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