Thermal stability of 5 nm barrier InAlN/GaN HEMTs


Published in:
2007 International Semiconductor Device Research Symposium, Vols 1 And 2, 320-321
Presented at:
International Semiconductor Device Research Symposium, College Pk, MD, Dec 12-14, 2007
Year:
2007
Publisher:
Ieee Service Center, 445 Hoes Lane, Po Box 1331, Piscataway, Nj 08855-1331 Usa
Laboratories:




 Record created 2012-02-13, last modified 2018-03-18


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