Conventional and 360 degree electron tomography of a micro-crystalline silicon solar cell
Duchamp, M.; Ramar, A.; Kovács, A.; Kasama, T.; Haug, F.-J.; Newcomb, S. B.; Ballif, C.; Dunin-Borkowski, R. E.
2011

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Abstract

Bright-field (BF) and annular dark-field (ADF) electron tomography in the transmission electron microscope (TEM) are used to characterize elongated porous regions or cracks (simply referred to as cracks thereafter) in micro-crystalline silicon (μc-Si:H) solar cell. The limitations of inferring the 3D geometry of a crack from a tilt series of images acquired from 100-nm-thick focused ion beam (FIB) milled TEM specimen are discussed. In an attempt to maximize the specimen tilt range and to reduce the effects of diffraction and phase contrast on the reconstruction, both BF and ADF electron tomography are used to acquire 360º tilt series of images from a FIB-prepared needle-shaped μc-Si:H specimen.

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Title Conventional and 360 degree electron tomography of a micro-crystalline silicon solar cell
Author(s) Duchamp, M. ; Ramar, A. ; Kovács, A. ; Kasama, T. ; Haug, F.-J. ; Newcomb, S. B. ; Ballif, C. ; Dunin-Borkowski, R. E.
Published in Journal of Physics: Conference Series
Volume 326
Pages 012057
Date 2011
ISSN 1742-6596
Note IMT-NE Number: 626
DOI https://doi.org/10.1088/1742-6596/326/1/012057
Laboratories PV-LAB
Record Appears in Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > PV-LAB - Photovoltaics and Thin Film Electronics Laboratory
Scientific production and competences > EPFL Partners > Neuchâtel Campus > PV-Lab - Photovoltaics and Thin Film Electronics Laboratory
Work produced at EPFL
Journal Articles
Published
Record creation date 2011-12-22

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