Quantum Point Contact Microscopy

We introduce quantum point contact microscopy (QPCM) as a novel method for surface characterization, where the conductance through a quantum point contact formed by a metal atom between the tip of a scanning tunneling microscope and the surface is mapped across the surface. Application of QPCM to copper and gold (111) shows reproducibly atomic resolution, on gold (111) the alternating atomic stacking of the surface reconstruction is observed in real space. The perspectives for chemical sensitivity in QPCM images are demonstrated for an iron platinum surface alloy where we observe local variations of the transport current due to changes in the chemical environment of the point contact.


Published in:
Nano Letters, 11, 3838-3843
Year:
2011
Keywords:
Laboratories:




 Record created 2011-12-16, last modified 2018-03-17


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