Quantum Point Contact Microscopy
We introduce quantum point contact microscopy (QPCM) as a novel method for surface characterization, where the conductance through a quantum point contact formed by a metal atom between the tip of a scanning tunneling microscope and the surface is mapped across the surface. Application of QPCM to copper and gold (111) shows reproducibly atomic resolution, on gold (111) the alternating atomic stacking of the surface reconstruction is observed in real space. The perspectives for chemical sensitivity in QPCM images are demonstrated for an iron platinum surface alloy where we observe local variations of the transport current due to changes in the chemical environment of the point contact.
Keywords: Scanning tunneling microscopy ; chemical sensitivity ; atomic resolution ; quantum transport ; Scanning-Tunneling-Microscopy ; Atomic-Force Microscopy ; Single-Atom ; Surface ; Conduction ; Au(111)
Record created on 2011-12-16, modified on 2016-08-09