000170600 001__ 170600
000170600 005__ 20190812205548.0
000170600 0247_ $$2doi$$a10.1109/Tasc.2011.2175676
000170600 02470 $$2ISI$$a000307364700251
000170600 037__ $$aCONF
000170600 245__ $$aStatistical analysis of the current-sharing temperature evolution in Nb3Sn cable-in-conduit-conductors for ITER
000170600 269__ $$a2012
000170600 260__ $$bIEEE-Inst Electrical Electronics Engineers Inc$$c2012$$aPiscataway
000170600 300__ $$a4
000170600 336__ $$aConference Papers
000170600 520__ $$aDuring the test of ITER conductors at nominal conditions, a degradation of the current sharing temperature has been observed after electromagnetic cyclic loading. Rather than focusing on the microscopic phenomena at the origin of the degradation, the degradation process has been studied from a statistical point of view, analysing the whole dataset of ITER conductors: average degradations have been calculated after various cycle numbers. Possible correlation with the strand critical current has also been analysed. In order to model the evolution of has been correlated with the reliability against cracks formation; the reliability is in turn defined according to a two parameters Weibull distribution. The validity of this approach has been tested with the so-called "Weibull plot". The Weibull exponents were calculated for several ITER conductors and were found to be lower than one, indicating that the failure rate, which may be regarded as the formation rate of fractures in the filaments composing the strands, is decreasing with the number of cycles.
000170600 6531_ $$asuperconductivity
000170600 700__ $$0244063$$g206422$$aUglietti, Davide
000170600 700__ $$0240064$$g106730$$aWesche, Rainer
000170600 700__ $$g134508$$aStepanov, Boris$$0240062
000170600 700__ $$aBruzzone, Pierluigi$$g113537$$0240063
000170600 7112_ $$dSeptember 11-16, 2011$$cMarseille, France$$aMT-22, International Conference on Magnet Technology
000170600 773__ $$j22$$tIEEE Transactions On Applied Superconductivity$$k3$$q4802204
000170600 909C0 $$pCRPP
000170600 909C0 $$pSPC$$0252028$$xU10136$$xU12267$$xU12269$$xU12271$$xU10559$$xU12273$$xU10557$$xU12270$$xU10137$$xU10636$$xU12266$$xU10635$$xU10558$$xU12268$$xU12272
000170600 909CO $$pconf$$pSB$$ooai:infoscience.tind.io:170600
000170600 917Z8 $$x218840
000170600 917Z8 $$x105317
000170600 917Z8 $$x218840
000170600 917Z8 $$x105317
000170600 917Z8 $$x105317
000170600 937__ $$aEPFL-CONF-170600
000170600 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000170600 980__ $$aCONF