BACKSCATTERED ELECTRON IMAGES OF POLISHED CEMENT SECTIONS IN THE SCANNING ELECTRON MICROSCOPE

Using a pair of backscattered electron detectors in the scanning electron microscope, images can be produced in which the intensity is dependent solely on the molecular weight of the imaged area, and independent of small fluctuations in topography. The use of this technique with polished, unetched cement sections, reveals the unhydrated material, massive calcium hydroxide and other hydration products as clearly distinguishable features of the microstructure.


Published in:
Proceedings of the International Conference on Cement Microscopy, null, null, 145-155
Year:
1984
Note:
Cited By (since 1996): 9
Export Date: 1 June 2011
Source: Scopus
Other identifiers:
Scopus: 2-s2.0-0021666317
Laboratories:




 Record created 2011-06-06, last modified 2018-03-17


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