Optical Binding In Scanning Probe Microscopy

When a light beam impinges on two interacting objects of subwavelength size, a spatially confined electromagnetic field arises in the immediate proximity of the particles. In scanning probe microscopy, short-range forces induced by this electromagnetic near-field change the magnitude of the probe tip-substrate interaction. In this letter we analyse the physical process responsible for these forces in the context of the localized field susceptibility method.


Published in:
Europhysics Letters, 26, 37-42
Year:
1994
Publisher:
EDP Sciences
ISSN:
0295-5075
Laboratories:




 Record created 2011-04-11, last modified 2018-12-03


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