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Generalized Field Propagator For Electromagnetic Scattering And Light Confinement

GIRARD, C. ; DEREUX, A. ; MARTIN, O. J. F.

Published in:
Physical Review Letters, 74, 526-529
Year:
1995
Publisher:
American Physical Society
ISSN:
0031-9007
Keywords:
Scanning Optical Microscopy ; Roughness
DOI:
10.1103/PhysRevLett.74.526
Other identifiers:
View record in Web of Science
Laboratories:
NAM

Record appears in:
Scientific production and competences > STI - School of Engineering > IMT - Institute of Microengineering > NAM - Nanophotonics and Metrology Laboratory
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Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published



 Record created 2011-04-11, last modified 2018-03-17

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